Probe for EPMA Xtreme v. 12.4.1
Table of contents
- Introduction
- Installation
- StartWin
- Stage
- CalMAC
- Coat
- UserWin
- Monitor
- Faraday
- GunAlign
- CalcZAF
- CalcZAF Window Details
-
CalcZAF Menu Details
- File
- Edit
- Standard
-
X-Ray
- X-Ray Database
- Calculate Spectrometer Positions
- Emission Table
- Edge Table
- Fluorescent Yield Table
- MAC Table
- MAC Table (Complete)
- Display MAC Emitter Absorber Pair
- Edit X-Ray Table
- Edit X-Edge Table
- Edit X-Flur Table
- Edit MAC Table
- Convert ELEMINFO.DAT
- Convert MACMAT*.DAT (Create CITZMU.DAT)
- Create New X-ray Database (XRAY.ALL to XRAY.MDB)
- Create New McMaster MAC Table
- Create New MAC30 MAC Table
- Create New MACJTA MAC Table
- Create New FFAST MAC Table
- Create New User Defined MAC Table
- Update Existing User Defined MAC Table
-
Analytical
- Display Current Sample Elements
- Calculate Secondary Fluorescence
- Calculate Elemental-To-Oxide Factors
- Calculate Oxide-to-Elemental Factors
- Students t Table
- Empirical MACs
- ZAF, Phi-Rho-Z, Alpha Factor and Calibration Curve Selections
- Operating Conditions
- Particle and Thin Film
- Use Conductive Coating Correction For Energy Loss
- Use Conductive Coating Correction For Absorption
- Calculate and Plot Binary Alpha factors
- Calculate and Output Binary K-ratios and A-factors for Periodic Table
- Binary Calculation Options
- Binary Histogram Options
- Calculate Binary Intensities (Output Calculated Intensities and Error Histogram)
- Calculate Binary Intensities (Output Calculated Intensities for All Matrix Corrections and MAC Files, Single Line, Single File)
- Calculate Binary Intensities (Output Calculated Intensities for All Matrix Corrections and MAC Files, All Lines, Multiple Files)
- Calculate Standard Concentrations (Output Calculated Concentrations and Errors)
- Calculate Standard Concentrations for All Matrix Corrections and MAC Files, Single Line, Single File)
- Calculate Binary Intensities (Output Atomic First Approximation)
- Calculate Binary Intensities (Output Mass First Approximation)
- Calculate Binary Intensities (Output Corrected Electron First Approximation)
- Calculate First Approximations Only (Atomic Fraction)
- Calculate First Approximations Only (Mass Fraction)
- Calculate First Approximations Only (Electron Fraction)
- Update Edge Line Flur Files
- Update Mac Files
- Convert Text To Data
- Run
- Output
- Help
- Standard
-
Standard Menu Details
-
File
- New
- Open
- Save As
- Close
- Import ASCII File
- Export ASCII File
- Import ASCII File (single row format)
- Export ASCII File (single row format)
- Create AMCSD Database (American Mineralogist Database)
- Import Standards From Cameca PeakSight (Sx.mdb)
- Import Standards From JEOL Text File
- File Information
- Print Log
- Print Setup
- Exit
- Edit
- Standard
- Options
- X-Ray
- Analytical
-
Output
- Log Window Font
- Debug Mode
- Extended Format
- Save To Disk Log
- View Disk Log
- Calculate Electron and X-ray Ranges
- Calculate Alternative Z-bars
- Calculate Continuum Absorption
- Calculate Charge Balance
- Calculate Total Cations
- Display Amphibole Calculations
- Display Biotite Calculations
- Display ZAF Calculations
- Help
-
File
- Probe for EPMA
-
Probe Window Details
-
Acquire!
- Beam Deflection and Column Condition Graphics
- Current Sample
- New Sample
- Elements/Cations
-
Background Types
- Off Peak Background Correction Types
- Linear Slope Calculation
- Exponential Slope Calculation
- Exponential Background Source
- Polynomial Background Source
- Background Options
- Same Side Off-Peaks
- MAN Backgrounds
- Spectrometer Number and Analyzing Crystal
- Interferences
- PHA
- Detector Parameters
- Integrated Intensity Options
- Variable Step Wavescan Options
- Specified Area Peak Factors (fixed composition APF)
- Load Element Setup
- Load Sample Setup
- Analytical Conditions
- Combined Conditions
- Locate
- PHA
- Count Times
- Standard Assignments
- Move
- Stage
- Peak/Scan Options
- Special Options
- Setups
- Setups
- Acquisition Options
-
Peaking Options
- Peak Center Options
- Peak Center Methods
- Non-ROM scan based
- ROM scan based
- ROM Based Peaking Scan:
- Spectrometer Peak Center Scans
- Initial Peak-To-Background Measurements
- Spectrometer Peak Center Procedure
- Interval Halving
- Parabolic Fit
- ROM Peaking
- Non-ROM scan based
- ROM scan based
- ROM Based Peaking Scan:
- Manual Peaking
- Final Peak-To-Background Measurements
- Post Scan Peak Confirmation
- Start Peaking
- Start Standard or Unknown Acquisition
- Imaging
- Start Wavescan
-
Analyze!
- Analyze
- Raw Data
- KRaws
- Analyze Selected Line(s)
- Excel
- Combine Selected Samples
- Pause Between Samples
- Use All Matrix Corrections
- Disable Selected Sample(s)
- Enable Selected Sample(s)
- Specified Concentrations
- Standard Assignments
- Name/Description
- Conditions
- Combined Conditions
- Elements/Cations
- Disable Selected Line(s)
- Enable Selected Line(s)
- List Standard Intensities
- Report
- Match
-
Calculation Options
- Do Not Use/Use EDS Spectrum Intensities
- Assign EDS Spectrum Elements
- Do Not Use/Use Integrated Intensities
- Display Results As Oxides and Calculate With Stoichiometric Oxygen
- Formula and Mineral Calculations
- Calculate Atomic Percents
- Element by Difference
- Stoichiometry to Oxygen
- Stoichiometry to Another Element
- Calculate Detection Limits
- Homogeneity Calculations
- Alternate Homogeneity Calculations
- Use Particle/Film Calculations
- Particle/Thin Film Model
- Particle Diameter
- Particle Density
- Particle Thickness Factor
- Numerical Integration Step
- Analyze Data
-
Automate!
- Position List
- Up/Down Arrow
- Select Stds
- Select All
- Delete All
- Re-Load
- Move
- Digitize
- Plot
- Fiducials
- Replicates
- Conditions
- Sample Setups
- File Setups
- Multiple Setups
- Delete Selected Samples
- Delete Selected Positions
- Import From ASCII File (*.POS)
- Export Selected Samples
- Import *.LEP
- Import *.DCD
-
Peak Spectrometers
- Spectrometer Peak Center Scans
- Initial Peak-To-Background Measurements
- Spectrometer Peak Center Procedure
- Non-ROM scan based
- ROM scan based
- ROM Based Peaking Scan:
- Interval Halving
- Parabolic Fit
- ROM Peaking
- Non-ROM scan based
- ROM scan based
- ROM Based Peaking Scan:
- Manual Peaking
- Final Peak-To-Background Measurements
- Post Scan Peak Confirmation
- Automation Actions
-
Automation Options
- Peak On Assigned Standards
- Use "Quick" Standards
- Considerations in the Use of "Quick" Standards
- Use of "Quick" Standards
- Use Filament Standby Afterwards
- Use Confirm During Acquisition
- Use Beam Deflection For Position
- Confirm All Positions In Sample
- Combine Multiple Sample Setups
- Use ROM Auto Focus
- Standard Points To Acquire
- Automate Confirm Delay
- Standard X Increment
- Re-Standard Y Increment
- Re-Standard Interval (hrs)
- Run Selected Samples
- Plot Wavescans!
-
Acquire!
-
Probe Menu Details
- File
- Edit
- Standard
- X-Ray
-
Analytical
-
Analysis Options
- Use Deadtime Correction
- Use Beam Drift Correction
- Use Automatic Drift Correction on Standard Intensities
- Use Assigned Interference Corrections on Standards and Unknowns
- Use Assigned or Self Time Dependent Intensity (TDI) Corrections on Unknowns
- Use Time Weighted Data For TDI Fit
- Use Absorption Corrected MAN Continuum Intensities
- Use Particle and Thin Film Correction Parameters
- Check For Same Peak Positions in Unknown and Standard
- Check For Same PHA Settings in Unknown and Standard
- Use Zero Point For Calibration Curve (Off-Peak Elements Only)
- Use Conductive Coating Correction for Beam Energy Loss
- Use Conductive Coating Correction for X-ray Absorption
- Do Not Use Fast Quantitative Analysis
- Use Empirical MAC Values
- Use Empirical APF Values
- Use Aggregated Intensities for Duplicate Quantitative Elements
- Use Blank Calibration Sample Trace Element Accuracy Corrections
- Force Negative K-ratios to Zero In ZAF Calculations
- Calculate Electron and X-ray Ranges For Sample Compositions
- Use Oxygen From Halogens (F, Cl, Br and I) Correction
- Use Nth Point Calculation For Off-Peak Intensities (for testing purposes only)
- Use Count Overwrite Table Intensity Table for Data Calculations
- Use Automatic Format For Results
- Use Detailed Printout for Data and Analytical Results
- Print Analyzed (Acquired) and Specified On Same Line
- Display Count Intensities Unnormalized To Time (in Analyze!)
- Display Charge Balance Calculation
- Elemental Output Sort Order
- Assign MAN Fits
- Clear All MAN Assignments
- Use Off Peak Elements For MAN Fit
- Use MAN Correction For Off Peak Elements
- Empirical MACs
- Empirical APFs
-
ZAF, Phi-Rho-Z, Alpha Factor and Calibration Curve Selections
- Alpha-Factors
- Use Empirical Alpha-Factors
- Use Penepma Alpha Factors
- Use Penepma K-ratio Limits
- Calibration Curve
- ZAF Matrix Corrections
- 1. Choice of mean ionization potentials:
- 2. Choice of backscatter coefficients:
- 3. Choice of absorption corrections:
- 4. Choice of Phi(0) expressions:
- 5. Choice of stopping power corrections:
- 6. Choice of backscatter loss corrections:
- Fluorescence Correction
- Mass Absorption Coefficients
- Create Virtual Standard Intensity
- Update Deadtime Constants
- Student's "t" Table
- CalcZAF Calculations
-
Analysis Options
- Window
-
Run
- List Run Summary
- List Rows, Names, Conditions
- List Anomalous Intensity Data for Standards or Unknowns
- List Sample Calculation Options
- List Standard Counts
- List Standard Compositions
- List Fiducial Coordinate Sets
- List Current MACs
- List Current APFs
- List Current Alpha Factors
- Display, Fit and Export Spectrometer Peak and PHA Scans
- Display, Annotate and Export Analog Signal Images
- Display and Export EDS Spectra
- Display and Export CL Spectra
- Display Time Dependent (TDI) and Alternating On/Off Intensities
- Display Integrated Intensities
- Display Calibration Curve Intensities
- Display Multi-Point Background Intensities
- Display PictureSnap
- Display Acquired Standard Positions on PictureSnap
- Display Acquired Unknown Positions on PictureSnap
- Display Acquired Wavescan Positions on PictureSnap
- Display Line Labels on PictureSnap
- Display Long Line Labels On PictureSnap
- Display Short Line Labels On PictureSnap
- Skip Disabled Points On PictureSnap
- Skip Duplicate Points on PictureSnap
-
Output
- Output Standard and Unknown Plots
- Output Automatic Traverse Plots
- Output Automatic Ternary Plots
- Save User Specified Format Output
- Save Custom Analysis Format #1 (C.G.S.)
- Save Custom Analysis Format #2 (H.T.)
- Save Custom Analysis Format #3 (J.H.)
- Save Custom Analysis Format #4 (J.J.D.)
- Save Custom Analysis Format #5 (J.J.D.-2)
- Save Custom Analysis Format #6 (H.W.)
- Save Custom Analysis Format #7 (NIST)
- Save Custom Analysis Format #8 (MAN)
- Save Custom Analysis Format #9 (P.C.)
- Save Wavescan Samples (based on sample names)
- Save Wavescan Samples (based on spectro/element)
- Save Wavescan Centroids
- Output Wavescan Spectrum Image (Lispix Format)
- Export Wavescan Samples for Feig Method Development Method Tool
- Save Images To BMP Files
- Save MultiPoint Position and Intensity Data
- Save Time Dependent Intensities (TDI)
- Save All EDS Spectra To EMSA (Output all EDS spectra to EMSA format files)
- Save All CL Spectra to EMSA (Output all CL spectra to EMSA format files)
- Save Trace Element Statistics
- Save Homogeneity Calculations
- Save U, Th, Pb Age Calculations
- Save Hanchar-Montel Geochron Calculations
- Save CalcZAF Format
- Save CalcZAF Standard Format
- Save StrataGem Format
- Save Cluster Classification Format (for CalcImage)
- Extended Format
- Debug Mode
- Verbose Mode
- Time Stamp Mode
- Driver Logging Mode
- Log Window Font
- Save To Disk Log
- View Disk Log
- Open File Viewer
- Open Link To Excel
- Close Link To Excel
- Help
- Appendix A
- Appendix B
- Appendix C
- Appendix D
- Appendix E
- Glossary of Terms
- Index