NIHSDIO_ATTR_HWC_FILTER_REPEATED_SAMPLE_ERRORS
Specific Attribute
| Data type |
Access | Applies to | Coercion | High-Level Functions |
|---|---|---|---|---|
| ViBoolean | R/W | None | None | None |
Description
Specifies whether the device stores and counts errors when the same error appears in consecutive samples. If this attribute is set to VI_TRUE, the device only counts distinct errors. An error is defined as distinct if the expected response value and the actual sample error do not change over the same number of Sample clock cycles. The niHSDIO_HWC_FetchSampleErrors function returns the number of clock cycles for which the repeated error occurred.
This attribute is helpful if your NI device clock rate is significantly faster than your DUT clock rate. In this case, one error from the DUT could result in several identical errors on the device.