NIHSDIO_ATTR_DATA_ACTIVE_EVENT_POSITION
Specific Attribute
| Data type |
Access | Applies to | Coercion | High-Level Functions |
|---|---|---|---|---|
| ViInt32 | R/W | N/A | None | None |
Description
Use this attribute to specify the position of the Data Active event relative to the Sample clock. Event voltages and positions are only relevant if the destination of the event is a front panel connector.
Defined Values:
| NIHSDIO_VAL_SAMPLE_CLOCK_RISING_EDGE (18) | The event is issued synchronously with the Sample clock rising edge. |
| NIHSDIO_VAL_SAMPLE_CLOCK_FALLING_EDGE (19) | The event is issued synchronously with the Sample clock falling edge. |
| NIHSDIO_VAL_DELAY_FROM_SAMPLE_CLOCK_RISING_EDGE (20) | The event is issued synchronously with delay from rising edge of the Sample clock. Specify the delay using NIHSDIO_ATTR_DATA_POSITION_DELAY. This choice has more jitter than the rising or falling edge values. Certain devices have Sample clock frequency limitations on when a custom delay can be used. Refer to the device documentation for details. |