NIHSDIO_ATTR_DATA_POSITION
Specific Attribute
Description
Specifies the data position for the operation,
which specifies which edge of the Sample clock
is used to time the generation or acquisition. You can
also configure the device to generate or acquire data at a configurable
delay past each rising edge of the Sample clock. When this attribute is set to
NIHSDIO_VAL_DELAY_FROM_SAMPLE_CLOCK_RISING_EDGE,
use NIHSDIO_ATTR_DATA_POSITION_DELAY to specify the delay value.
 |
Note To configure a delay on NI 656x devices,
you must delay all channels on the device. NI-HSDIO returns an error if you
apply a delay to only a partial channel list. |
Defined Values:
| NIHSDIO_VAL_SAMPLE_CLOCK_RISING_EDGE (18) |
The device samples or generates data on the Sample clock rising edge. |
| NIHSDIO_VAL_SAMPLE_CLOCK_FALLING_EDGE (19) |
The device samples or generates data on the Sample clock falling edge. |
| NIHSDIO_VAL_DELAY_FROM_SAMPLE_CLOCK_RISING_EDGE (20) |
The device samples or generates data with a delay from the
Sample clock rising edge. Specify the delay using
NIHSDIO_ATTR_DATA_POSITION_DELAY.
This choice has more jitter than the rising or falling edge values. Certain devices have
Sample clock frequency limitations on when a custom delay can be used. Refer to the
device sections for details. |