Selected References
A. L. Albee and L. Ray, "Correction factors for electron probe microanalysis of silicates, oxides, carbonates, phosphates, and sulfates", Analytical Chemistry, 42, 1408-1414, (1970)
J. T. Armstrong and P. Buseck, "Quantitative Chemical Analysis of Individual Micro-particles using the Electron Microprobe" Anal. Chem. 47: 1975, p 2178
J. T. Armstrong, "Quantitative analysis of silicates and oxide minerals: Comparison of Monte-Carlo, ZAF and Phi-Rho-Z procedures," Microbeam Analysis--1988, p 239-246.
J. T. Armstrong, "Bence-Albee after 20 years: Review of the Accuracy of a-factor Correction Procedures for Oxide and Silicate Minerals," Microbeam Analysis--1988, p 469-476.
G. F. Bastin and H. J. M. Heijligers, "Quantitative Electron Probe Microanalysis of Carbon in Binary Carbides," Parts I and II, X-Ray Spectr. 15: 135-150, 1986
A. E. Bence and A. L. Albee, "Empirical correction factors for the electron microanalysis of silicates and oxides". Journal of Geology, 76, 382-403, (1968)
M.G.C. Cox, Experimental determination of x-ray intensities, in Quantitative Electron-Probe Microanalysis (ed. V.D. Scott and G. Love), Wiley, New York, p 125-146, 1983
W. A. Deer, R. A. Howie, J. Zussman, "An Introduction to the Rock Forming Minerals", Longman, Essex, London, 1966
J. J. Donovan and M. L. Rivers, "PRSUPR: A PC-Based Automation and Analysis Software Package for Wavelength-Dispersive Electron-Beam Microanalysis" Microbeam Analysis, 1990, p. 66-68
J. J. Donovan and V. C. Kress, "PRTASK: A PC-Based Acquisition and Analysis Software Package for Interfacing to the Tracor TASK Automation System" Microbeam Analysis, 1991, p. 351
J. J. Donovan, M. L. Rivers and J. T. Armstrong, "PRSUPR: Automation and Analysis Software for Wavelength Dispersive Electron-beam Microanalysis on a PC" in Am. Mineral., v. 77, 1992, p. 444
J. J. Donovan, D. A. Snyder and M. L. Rivers, "An Improved Interference Correction for Trace Element Analysis" Microbeam Analysis, 2: 23-28, 1993
J. J. Donovan and T. N. Tingle, "An Improved Mean Atomic Number Correction for Quantitative Microanalysis" in Journal of Microscopy and Microanalysis, v. 2, 1, p. 1-7, 1996
J. J. Donovan and A. N. Westphal, "Averaging of electron backscatter and x-ray continuum intensities in multi-element compounds" in Microbeam Analysis Proceedings Williams DB and Shimizu R, Institute of Physics Publishing, Bristol and Philadelphia, Series Number 165, p 431, 2000
J. J. Donovan and N. E. Pingitore, "Composition Averaging of Continuum Intensities in Multi-Element Compounds", Microscopy & Microanalysis, 2002, v. 8, 429-436
J. J. Donovan, N. E. Pingitore and A. N. Westphal, "Composition Averaging of Backscatter Intensities in Compounds", Microscopy & Microanalysis, 2003, v. 9, 202-215
J. J. Donovan, et. al., "Improved Electron Probe Microanalysis of Trace Elements in Quartz", American Mineralogist, 96, 274282, 2011
J. Z. Frazer, ISM Report 67-29, 1967.
J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, E. Lifshin, "Scanning Electron Microscopy and X-Ray Microanalysis", Plenum, New York, 1981
K. F. J. Heinrich, in "The Electron Microprobe", T. D. McKinley, K. F. J. Heinrich and D. B. Wittry, Eds., Wiley, pp. 296-366: 1966.
K. F. J. Heinrich, "Mass Absorption Coefficients for Electron Probe Microanalysis" in Proc. 11th ICXOM, pp. 67-119: 1987.
B. L. Henke, P. Lee, T. J. Tanaka, R. L. Shimabukuro and B. K. Fijikawa, Atomic Data Nucl. Data Tables 27, 1 (1982)
B. L. Henke and E. S. Ebisu, "Tables of Mass Absorption Coefficients", Adv. X-Ray Anal. 17, 150 (1974)
W. H. McMaster, N. Kerr Del Grande, J. H. Mallet and J. H. Hubbell, "Compilation of x-ray cross sections", Lawrence Livermore Lab., 1969.
A. V. McQuire, C. A. Francis, M. D. Dyar, "Mineral standards for electron microprobe analysis of oxygen", Am. Mineral., 77, 1992, p. 1087-1091.
C. H. Nielsen and H. Sigurdsson, "Quantitative methods for electron microprobe analysis of sodium in natural and synthetic glasses", Am. Mineral., 66, p. 547-552, 1981
J. L. Pouchou and F. M. A. Pichoir, "Determination of Mass Absorption Coefficients for Soft X-Rays by use of the Electron Microprobe" Microbeam Analysis, Ed. D. E. Newbury, San Francisco Press, 1988, p. 319-324.
Press et al. (1986) "Numerical Recipes: The Art of Scientific Computing", Cambridge University Press, 818 pp.
J. Ruste, "Mass Absorption Coefficients", J. Microsc. Spectrosc. Electron. 4, 123 (1979)
V. D. Scott and G. Love, "Quantitative Electron-Probe Microanalysis", Wiley & Sons, New York, 1983
K. G. Snetsinger, T. E. Bunch and K. Keil, "Electron Microprobe Analysis of Vanadium in the Presence of Titanium", Am. Mineral., v. 53, (1968) p. 1770-1773
E. W. White and G. G. Johnson, "X-Ray Emission and Absorption Edge Wavelengths and Interchange Settings for LiF Geared Curved Crystal Spectrometers", Pennsylvania State University Special Publication No. 1-70, 2nd Edition, (1979)
J. P. Willis, "Course on Theory and Practice of XRF Spectrometry", University of Western Ontario, Department of Geology, Course Notes, 1993
T. O. Ziebold, "Precision and sensitivity in electron microprobe analysis", Analytical Chemistry, 39, 858-861, (1967)
T. O. Ziebold and R. E. Ogilvie," Quantitative analysis with the electron microanalyzer", Analytical Chemistry, 35, 621-627, (1963)
T. O. Ziebold and R. E. Ogilvie, "An empirical method for electron microanalysis", Analytical Chemistry, 36, 322-327, (1964).