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Table of contents

  • Introduction
    • Description
    • License
    • Special Thanks
    • Technical Support
    • Analysis Concepts
      • Standard and Unknowns Easily Run Under Identical Conditions
      • Easy Wavescan Acquisition and Graphical Off-Peaks Assignment
      • Easy and Flexible Standard Re-assignment Capability
      • Automatic Interference Calibration
      • Single Relational Database for Data Integrity
      • History of Probe for EPMA
    • General References
    • Selected References
    • Specialized References
      • Peak Shifts
      • Light Elements
      • Time Dependent Intensity (TDI) Element Corrections
      • Glass Analysis
    • Disclaimer
  • Installation
    • Platform Requirements
      • Minimum
      • Preferred
    • Installation
      • Installation Using Probe for EPMA.msi and CalcZAF.msi
      • Files Used by Probe for EPMA
      • Running Probe for EPMA for the First Time
      • Other Programs Supplied With Probe for EPMA
      • Removing Probe for EPMA
      • Copy Protection
    • Configuration Files
      • Constants for array declarations
      • PROBEWIN.INI
        • [General]
        • [Software]
        • [Hardware]
        • [Image]
        • [Serial]
        • [Faraday]
        • [Counting]
        • [PHA]
        • [Plot]
        • [Standards]
        • [monitor]
      • ELEMENTS.DAT
      • CHARGES.DAT
      • CRYSTALS.DAT
      • MOTORS.DAT
        • Some other helpful expressions :
      • SCALERS.DAT
        • Pre and Post Scan Ranges
        • ROM Peak Scan Range
        • Software Based Peaking
        • ROM Based Peaking
        • SCALERS.DAT Lines 21-41
        • Extended Format SCALERS.DAT Lines 42-83
      • DETECTORS.DAT
  • StartWin
    • Overview
    • Description
      • Beam and Detector Stability
      • Spectrometer Reproducibility
      • Deadtime Calibration
      • PHA
      • Peak/Scan Options
      • Alignment Peak Center
      • Calibrate Peak Center
        • Multiple Peak Calibration for Spectrometer to Angstroms Calculations
  • Stage
    • Overview
    • Description
      • Digitize Positions
        • Stage
        • Position File (*.POS) File Formats
        • Import *.LEP
        • Import *.DCD
        • Picture Snap
        • Digitizing Standard Mounts with More than 128 Standards
      • Import Positions From Cameca PeakSight
  • CalMAC
    • Overview
      • Features
  • Coat
    • Overview
      • Features
  • UserWin
    • Overview
    • Description
      • Creating a New User Database
      • Calculating Hourly Usage
      • Using the Data Cursor
      • Modifying the Custom Data Fields
  • Monitor
    • Overview
  • Faraday
    • Overview
  • GunAlign
    • Overview
  • CalcZAF
    • Overview
    • Description
      • Importing Concentration or Intensity Data From a Disk File
        • An example of a CalcZAF input file demonstrating each calculation mode is shown here:
      • Calculating Error Histograms from Binary Composition Input Files
    • Log Window
  • CalcZAF Window Details
    • ZAF Calculation Window Details
      • Calculate
      • Close
      • Excel Options
      • >>Excel
      • Combined Conditions
      • Enter Composition As Atom String
      • Enter Composition As Weight String
      • Enter Composition As Standard
      • Calculation Options
        • Calculate With Stoichiometric Oxygen
        • Calculate As Elemental
        • Element by Difference
        • Stoichiometry to Oxygen
        • Stoichiometry to Another Element
      • Load Next Dataset From Input File
      • Copy Grid To Clipboard
  • CalcZAF Menu Details
    • File
      • Open CalcZAF Input Data File
      • Close CalcZAF Input Data File
      • Export CalcZAF Input Data File
      • Update CalcZAF Example Data Files
      • Print Log
      • Print Setup
      • Exit
    • Edit
      • Cut
      • Copy
      • Paste
      • Select All
      • Clear All
    • Standard
      • Standard Database
      • Select Standard Database
      • Edit Standard Coating Parameters
      • Add/Remove Standards To/From Run
    • X-Ray
      • X-Ray Database
      • Calculate Spectrometer Positions
      • Emission Table
      • Edge Table
      • Fluorescent Yield Table
      • MAC Table
      • MAC Table (Complete)
      • Display MAC Emitter Absorber Pair
      • Edit X-Ray Table
      • Edit X-Edge Table
      • Edit X-Flur Table
      • Edit MAC Table
      • Convert ELEMINFO.DAT
      • Convert MACMAT*.DAT (Create CITZMU.DAT)
      • Create New X-ray Database (XRAY.ALL to XRAY.MDB)
      • Create New McMaster MAC Table
      • Create New MAC30 MAC Table
      • Create New MACJTA MAC Table
      • Create New FFAST MAC Table
      • Create New User Defined MAC Table
      • Update Existing User Defined MAC Table
    • Analytical
      • Display Current Sample Elements
      • Calculate Secondary Fluorescence
      • Calculate Elemental-To-Oxide Factors
      • Calculate Oxide-to-Elemental Factors
      • Students’ “t” Table
      • Empirical MACs
      • ZAF, Phi-Rho-Z, Alpha Factor and Calibration Curve Selections
      • Operating Conditions
      • Particle and Thin Film
        • Particle/Thin Film Model
        • Particle Diameter
        • Particle Density
        • Particle Thickness Factor
        • Numerical Integration Step
      • Use Conductive Coating Correction For Energy Loss
      • Use Conductive Coating Correction For Absorption
      • Calculate and Plot Binary Alpha factors
      • Calculate and Output Binary K-ratios and A-factors for Periodic Table
      • Binary Calculation Options
      • Binary Histogram Options
      • Calculate Binary Intensities (Output Calculated Intensities and Error Histogram)
      • Calculate Binary Intensities (Output Calculated Intensities for All Matrix Corrections and MAC Files, Single Line, Single File)
      • Calculate Binary Intensities (Output Calculated Intensities for All Matrix Corrections and MAC Files, All Lines, Multiple Files)
      • Calculate Standard Concentrations (Output Calculated Concentrations and Errors)
      • Calculate Standard Concentrations for All Matrix Corrections and MAC Files, Single Line, Single File)
      • Calculate Binary Intensities (Output Atomic First Approximation)
      • Calculate Binary Intensities (Output Mass First Approximation)
      • Calculate Binary Intensities (Output Corrected Electron First Approximation)
      • Calculate First Approximations Only (Atomic Fraction)
      • Calculate First Approximations Only (Mass Fraction)
      • Calculate First Approximations Only (Electron Fraction)
      • Update Edge Line Flur Files
      • Update Mac Files
      • Convert Text To Data
    • Run
      • List Standard Compositions
      • List Current MACs
      • List Current Alpha Factors
      • List Analysis Parameters
      • Model Detection Limits
      • Calculate Electron and X-ray Ranges
      • Calculate Sample Temperature Rise
    • Output
      • Log Window Font
      • Debug Mode
      • Verbose Mode
      • ZAF Equation Mode
      • Extended Format
      • Save To Disk Log
      • View Disk Log
      • Open Link To Excel
      • Close Link To Excel
    • Help
      • About CalcZAF
      • Help On CalcZAF
      • Update CalcZAF
      • Probe Software On The Web
  • Standard
    • Overview
    • Log Window
    • Running Standard for the First Time
  • Standard Menu Details
    • File
      • New
      • Open
      • Save As
      • Close
      • Import ASCII File
      • Export ASCII File
      • Import ASCII File (single row format)
      • Export ASCII File (single row format)
      • Create AMCSD Database (American Mineralogist Database)
      • Import Standards From Cameca PeakSight (Sx.mdb)
      • Import Standards From JEOL Text File
      • File Information
      • Print Log
      • Print Setup
      • Exit
    • Edit
      • Cut
      • Copy
      • Paste
      • Select All
      • Clear All
    • Standard
      • New
        • Formula Entry
      • Modify
      • Duplicate
      • Delete
      • Delete Selected
      • List All Standard Names
      • List Elemental Standard Names
      • List Oxide Standard Names
      • List Selected Standards
      • List All Standards
      • List Elemental Standards
      • List Oxide Standards
    • Options
      • Search
      • Find
      • Match
        • Weight Percent Entry
      • Modal Analysis
        • Creating an Input File
        • Modal Analysis Options
        • Defining Modal Phases
      • Interferences
    • X-Ray
      • X-Ray Database
        • Description of the X-ray Database (adapted from NIST documentation by C. Fiori)
      • Emission Table
      • Edge Table
      • Fluorescent Yield Table
      • MAC Table
    • Analytical
      • Empirical MACs
      • ZAF, Phi-Rho-Z, Alpha Factor and Calibration Curve Selections
      • Operating Conditions
      • MQ (Monte-Carlo) Calculations
        • Creating MQ Input Files From Standard Database Compositions
        • Using the MCARLO.BAT Batch File
        • Creating MQ Input Files For Pure Elements or Binary Compositions
        • Parsing MQ Output Files
      • PENEPMA (Monte-Carlo) Calculations
        • Creating Material and Input Files for PENEPMA
      • PENEPMA (Secondary Fluorescence Profile) Calculations
        • PENEPMA Material Files (create .MAT files)
        • Run Primary Intensity Calculations (create .PAR files)
        • Calculate Secondary Fluorescence Profiles
        • Send To Excel
        • Assumption Of Bulk Matrix Corrections
        • Compositions Exhibiting Self Fluorescence Adjacent to a Non-Fluorescing Phase
    • Output
      • Log Window Font
      • Debug Mode
      • Extended Format
      • Save To Disk Log
      • View Disk Log
      • Calculate Electron and X-ray Ranges
      • Calculate Alternative Z-bars
      • Calculate Continuum Absorption
      • Calculate Charge Balance
      • Calculate Total Cations
      • Display Amphibole Calculations
      • Display Biotite Calculations
      • Display ZAF Calculations
    • Help
      • About Standard
      • Help On Standard
  • Probe for EPMA
    • Overview
    • Log Window
    • Menus
    • Buttons
  • Probe Window Details
    • Acquire!
      • Beam Deflection and Column Condition Graphics
      • Current Sample
      • New Sample
        • Load Element Setup
        • Load Sample Setup
        • Load File Setup
        • Load Multiple Setups
      • Elements/Cations
        • Disable Acq
        • Disable Quant
        • Multiple Peak Calibration
      • Background Types
        • Off Peak Background Correction Types
        • Linear Slope Calculation
        • Exponential Slope Calculation
        • Exponential Background Source
        • Polynomial Background Source
        • Background Options
        • Same Side Off-Peaks
        • MAN Backgrounds
        • Spectrometer Number and Analyzing Crystal
        • Interferences
        • PHA
        • Detector Parameters
        • Integrated Intensity Options
        • Variable Step Wavescan Options
        • Specified Area Peak Factors (fixed composition APF)
        • Load Element Setup
        • Load Sample Setup
      • Analytical Conditions
        • Analytical Conditions versus Column Conditions
        • Force Size or Force Column Conditions
        • Pre and Post Acquire Strings
        • Faraday Stage
      • Combined Conditions
      • Locate
      • PHA
      • Count Times
        • MultiPoint Background Counting Times
        • Wavescan Counting Times
        • Non-ROM scan based
        • ROM scan based
        • ROM Based Peaking Scan:
        • Max Counts and Unknown Count Factor Parameters
        • Beam Current Measurement and Beam Drift
        • Off-Peak Statistics
      • Standard Assignments
      • Move
      • Stage
        • Stage and Spectrometer Target Positions
        • Faraday In/Out or Beam Blanked/Unblanked
        • Update Positions
        • Jog Stage
        • Jog Spectrometers
        • Free/Clear
        • Periodic/Peak and PHA buttons
        • Positions
        • Stage
        • Close
        • Go
      • Peak/Scan Options
        • Spectrometer ROM scanning versus Step/Count Scanning
      • Special Options
        • Self Calibration Time Dependent Intensity (TDI) Acquisition
        • Assigned Calibration Time Dependent Intensity (TDI) Acquisition
      • Setups
        • Quick Wavescan Acquisition
        • Non-ROM scan based
        • ROM scan based
        • ROM Based Peaking Scan:
      • Setups
      • Acquisition Options
        • Quick Standard Modes
        • EDS Acquisition
        • EDS Spectrum Intensity Acquisition
        • Automated Image Acquisition
        • Peak Element Before Acquisition
        • Nth Point Off-Peak Acquisition
      • Peaking Options
        • Peak Center Options
        • Peak Center Methods
        • Non-ROM scan based
        • ROM scan based
        • ROM Based Peaking Scan:
        • Spectrometer Peak Center Scans
        • Initial Peak-To-Background Measurements
        • Spectrometer Peak Center Procedure
        • Interval Halving
        • Parabolic Fit
        • ROM Peaking
        • Non-ROM scan based
        • ROM scan based
        • ROM Based Peaking Scan:
        • Manual Peaking
        • Final Peak-To-Background Measurements
        • Post Scan Peak Confirmation
      • Start Peaking
      • Start Standard or Unknown Acquisition
      • Imaging
        • Image Calibration
      • Start Wavescan
    • Analyze!
      • Analyze
        • Error Messages
        • Problems With the Analysis
        • Description of the Analysis Printout
        • Summary of Analysis Printout
        • Example of Analysis Printout
      • Raw Data
        • Summary of Data Printout (standards and unknowns)
        • Example of Data Printout (standards and unknowns)
        • Summary of Data Printout (wavescans)
      • KRaws
        • Example of K-Raw Output
      • Analyze Selected Line(s)
      • Excel
      • Combine Selected Samples
      • Pause Between Samples
      • Use All Matrix Corrections
      • Disable Selected Sample(s)
      • Enable Selected Sample(s)
      • Specified Concentrations
        • Specify By Standard
        • Specify By Formula
        • Specify By Analysis
        • Specify By Unknown Sample
        • Specify By Text File Input
      • Standard Assignments
        • Virtual Standard Intensities
        • Spectral Interferences
        • Area Peak Factors and Standard Assignments
        • Checking (Secondary) Standards
        • Time Dependent Intensity (TDI) Element Corrections
        • Mathematical Method
        • Blank Correction
      • Name/Description
      • Conditions
      • Combined Conditions
      • Elements/Cations
        • Off Peak Background Correction Types
        • Linear Slope Calculation
        • Exponential Slope Calculation
        • Polynomial Background Source
        • Background and Interference Calculations
        • Same Side Off-Peaks
        • Interferences
        • Specified Area Peak Factors (fixed composition APF)
        • Save Element Setup
        • Save Sample Setup
      • Disable Selected Line(s)
      • Enable Selected Line(s)
      • List Standard Intensities
      • Report
      • Match
      • Calculation Options
        • Do Not Use/Use EDS Spectrum Intensities
        • Assign EDS Spectrum Elements
        • Do Not Use/Use Integrated Intensities
        • Display Results As Oxides and Calculate With Stoichiometric Oxygen
        • Formula and Mineral Calculations
        • Calculate Atomic Percents
        • Element by Difference
        • Stoichiometry to Oxygen
        • Stoichiometry to Another Element
        • Calculate Detection Limits
        • Homogeneity Calculations
        • Alternate Homogeneity Calculations
        • Use Particle/Film Calculations
        • Particle/Thin Film Model
        • Particle Diameter
        • Particle Density
        • Particle Thickness Factor
        • Numerical Integration Step
      • Analyze Data
    • Automate!
      • Position List
      • Up/Down Arrow
      • Select Stds
      • Select All
      • Delete All
      • Re-Load
      • Move
      • Digitize
        • Creating Standard Position Samples
        • Creating Unknown Position Samples
        • Picture Snap
        • Single Point(s)
        • Shotgun
        • Linear Traverse
        • Rectangular Grid
        • Polygon Grid
        • Digitize Image
        • Image Calibration
        • Digitize Cluster (of Random Points)
      • Plot
      • Fiducials
      • Replicates
      • Conditions
      • Sample Setups
      • File Setups
      • Multiple Setups
      • Delete Selected Samples
      • Delete Selected Positions
      • Import From ASCII File (*.POS)
        • Fiducial Marks
      • Export Selected Samples
      • Import *.LEP
      • Import *.DCD
      • Peak Spectrometers
        • Spectrometer Peak Center Scans
        • Initial Peak-To-Background Measurements
        • Spectrometer Peak Center Procedure
        • Non-ROM scan based
        • ROM scan based
        • ROM Based Peaking Scan:
        • Interval Halving
        • Parabolic Fit
        • ROM Peaking
        • Non-ROM scan based
        • ROM scan based
        • ROM Based Peaking Scan:
        • Manual Peaking
        • Final Peak-To-Background Measurements
        • Post Scan Peak Confirmation
      • Automation Actions
      • Automation Options
        • Peak On Assigned Standards
        • Use "Quick" Standards
        • Considerations in the Use of "Quick" Standards
        • Use of "Quick" Standards
        • Use Filament Standby Afterwards
        • Use Confirm During Acquisition
        • Use Beam Deflection For Position
        • Confirm All Positions In Sample
        • Combine Multiple Sample Setups
        • Use ROM Auto Focus
        • Standard Points To Acquire
        • Automate Confirm Delay
        • Standard X Increment
        • Re-Standard Y Increment
        • Re-Standard Interval (hrs)
      • Run Selected Samples
        • Use Last Unknown Sample
        • Use Digitized Conditions
        • Use Digitized Sample Setups
        • Use Digitized File Setups
        • Use Digitized Multiple Setups
    • Plot Wavescans!
      • Output Target
        • Include Disabled Points
        • Data Point labels
        • ASCII File Column Labels
        • Run Information
        • Sample Names
        • Force Black and White Print
        • Off Peak Labels
        • SURFER .BAS File
        • SURFER Instructions
        • Normalize Y Sets
        • Normalize Samples (Y Sets)
      • Graph Type
        • Analyzed Elements Only
        • Average Only
        • Minimum Total
      • Error Bars
        • Plot Error Bars
        • Plot Nth Bars
        • Error Bar Calculations
      • Output
        • Graph Data
        • ASCII File Output
        • Plotting Standard and Unknown Data
        • Plotting Wavescan Data
        • KLM Markers
        • Load X-ray Database
        • Low and High Off Peak Positions
        • Model Background
        • Area Peak Factor Calculations
      • Close
  • Probe Menu Details
    • File
      • New
      • Open
      • Save As
      • Close
      • Find File
      • File Information
      • Compact
      • Export Probe Configuration Files…
      • Import Probe Configuration Files…
      • Print Log
      • Print Setup
      • User Wizard
      • Probe for EPMA Quick Start Guide
      • Probe for EPMA Frequently Asked Questions Guide
      • Exit
    • Edit
      • Cut
      • Copy
      • Copy Special
      • Paste
      • Paste Special
      • Select All
      • Clear All
    • Standard
      • Standard Database
      • Evaluate Standards
      • Select Standard Database
      • Edit Standard Coating Parameters
      • Add/Remove Standards To/From Run
    • X-Ray
      • X-Ray Database
        • Description of the X-ray Database (adapted from NIST documentation by C. Fiori)
      • Spectrometer Table
      • Emission Table
      • Edge Table
      • Fluorescent Yield Table
      • MAC Table
    • Analytical
      • Analysis Options
        • Use Deadtime Correction
        • Use Beam Drift Correction
        • Use Automatic Drift Correction on Standard Intensities
        • Use Assigned Interference Corrections on Standards and Unknowns
        • Use Assigned or Self Time Dependent Intensity (TDI) Corrections on Unknowns
        • Use Time Weighted Data For TDI Fit
        • Use Absorption Corrected MAN Continuum Intensities
        • Use Particle and Thin Film Correction Parameters
        • Check For Same Peak Positions in Unknown and Standard
        • Check For Same PHA Settings in Unknown and Standard
        • Use Zero Point For Calibration Curve (Off-Peak Elements Only)
        • Use Conductive Coating Correction for Beam Energy Loss
        • Use Conductive Coating Correction for X-ray Absorption
        • Do Not Use Fast Quantitative Analysis
        • Use Empirical MAC Values
        • Use Empirical APF Values
        • Use Aggregated Intensities for Duplicate Quantitative Elements
        • Use Blank Calibration Sample Trace Element Accuracy Corrections
        • Force Negative K-ratios to Zero In ZAF Calculations
        • Calculate Electron and X-ray Ranges For Sample Compositions
        • Use Oxygen From Halogens (F, Cl, Br and I) Correction
        • Use Nth Point Calculation For Off-Peak Intensities (for testing purposes only)
        • Use Count Overwrite Table Intensity Table for Data Calculations
        • Use Automatic Format For Results
        • Use Detailed Printout for Data and Analytical Results
        • Print Analyzed (Acquired) and Specified On Same Line
        • Display Count Intensities Unnormalized To Time (in Analyze!)
        • Display Charge Balance Calculation
        • Elemental Output Sort Order
      • Assign MAN Fits
        • MAN Backgrounds
        • Selecting Suitable Standards for the MAN Calibration
        • MAN Background Assignments
        • Correction for Absorption of the Continuum
        • Graphical Plot of Background vs. Z-bar
      • Clear All MAN Assignments
      • Use Off Peak Elements For MAN Fit
      • Use MAN Correction For Off Peak Elements
      • Empirical MACs
      • Empirical APFs
        • Oxygen Area Peak Factors (APF)
        • Carbon Area-Peak Factors
        • Nitrogen Area-Peak Factors
        • Calculation of Compound APFs
      • ZAF, Phi-Rho-Z, Alpha Factor and Calibration Curve Selections
        • Alpha-Factors
        • Use Empirical Alpha-Factors
        • Use Penepma Alpha Factors
        • Use Penepma K-ratio Limits
        • Calibration Curve
        • ZAF Matrix Corrections
        • 1. Choice of mean ionization potentials:
        • 2. Choice of backscatter coefficients:
        • 3. Choice of absorption corrections:
        • 4. Choice of Phi(0) expressions:
        • 5. Choice of stopping power corrections:
        • 6. Choice of backscatter loss corrections:
        • Fluorescence Correction
        • Mass Absorption Coefficients
      • Create Virtual Standard Intensity
      • Update Deadtime Constants
      • Student's "t" Table
      • CalcZAF Calculations
    • Window
      • Stage
      • Move
      • Ratemeter
      • Kiosk Display Mode
      • Analytical Conditions
      • Load Column Conditions From File
      • Save Column Conditions To File
      • View Column Conditions File
      • Filament Standby On
      • Filament Standby Off
      • Turn Detector Bias Voltages Off
      • Turn Detector Bias Voltages On
      • Reset Current Window Positions To Default
    • Run
      • List Run Summary
      • List Rows, Names, Conditions
      • List Anomalous Intensity Data for Standards or Unknowns
      • List Sample Calculation Options
      • List Standard Counts
      • List Standard Compositions
      • List Fiducial Coordinate Sets
      • List Current MACs
      • List Current APFs
      • List Current Alpha Factors
      • Display, Fit and Export Spectrometer Peak and PHA Scans
      • Display, Annotate and Export Analog Signal Images
      • Display and Export EDS Spectra
      • Display and Export CL Spectra
      • Display Time Dependent (TDI) and Alternating On/Off Intensities
      • Display Integrated Intensities
      • Display Calibration Curve Intensities
      • Display Multi-Point Background Intensities
        • Load Wavescan
      • Display PictureSnap
      • Display Acquired Standard Positions on PictureSnap
      • Display Acquired Unknown Positions on PictureSnap
      • Display Acquired Wavescan Positions on PictureSnap
      • Display Line Labels on PictureSnap
      • Display Long Line Labels On PictureSnap
      • Display Short Line Labels On PictureSnap
      • Skip Disabled Points On PictureSnap
      • Skip Duplicate Points on PictureSnap
    • Output
      • Output Standard and Unknown Plots
      • Output Automatic Traverse Plots
      • Output Automatic Ternary Plots
      • Save User Specified Format Output
      • Save Custom Analysis Format #1 (C.G.S.)
      • Save Custom Analysis Format #2 (H.T.)
      • Save Custom Analysis Format #3 (J.H.)
      • Save Custom Analysis Format #4 (J.J.D.)
      • Save Custom Analysis Format #5 (J.J.D.-2)
      • Save Custom Analysis Format #6 (H.W.)
      • Save Custom Analysis Format #7 (NIST)
      • Save Custom Analysis Format #8 (MAN)
      • Save Custom Analysis Format #9 (P.C.)
      • Save Wavescan Samples (based on sample names)
      • Save Wavescan Samples (based on spectro/element)
      • Save Wavescan Centroids
      • Output Wavescan Spectrum Image (Lispix Format)
      • Export Wavescan Samples for Feig Method Development Method Tool
      • Save Images To BMP Files
      • Save MultiPoint Position and Intensity Data
      • Save Time Dependent Intensities (TDI)
      • Save All EDS Spectra To EMSA (Output all EDS spectra to EMSA format files)
      • Save All CL Spectra to EMSA (Output all CL spectra to EMSA format files)
      • Save Trace Element Statistics
      • Save Homogeneity Calculations
      • Save U, Th, Pb Age Calculations
      • Save Hanchar-Montel Geochron Calculations
      • Save CalcZAF Format
      • Save CalcZAF “Standard” Format
      • Save StrataGem Format
      • Save Cluster Classification Format (for CalcImage)
      • Extended Format
      • Debug Mode
      • Verbose Mode
      • Time Stamp Mode
      • Driver Logging Mode
      • Log Window Font
      • Save To Disk Log
      • View Disk Log
      • Open File Viewer
      • Open Link To Excel
      • Close Link To Excel
    • Help
      • About Probe for EPMA
      • Help On Probe for EPMA
      • User Reference Manual
      • Getting Started Manual
      • Advanced Topics Manual
      • Update Probe for EPMA
      • Display Program Information
      • Probe Software On The Web
      • User Wizard
      • Probe for EPMA Quick Start Guide
      • Probe for EPMA Frequently Asked Questions
  • Appendix A
    • Upgrading from Probe for Windows 32 Bit to Probe for EPMA
  • Appendix B
    • Problems with Light Element Analysis
      • Physical and Chemical Effects
      • Problems with the Measurement Techniques
  • Appendix C
    • Use of Empirical MACs
      • Empirical Mass Absorption Coefficients (MACs)
  • Appendix D
    • Problems with the Analysis
  • Appendix E
    • Problems with the carbon or conductive coating
  • Glossary of Terms
  • Index

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