Light Elements
Armstrong, J.T. (1988) Accurate quantitative analysis of oxygen and nitrogen with a W/Si multi-layer crystal, in D.E. Newbury, ed., Microbeam Analysis, p. 301-304
Bastin, G.F. and Heijligers, H.J.M (1991) Quantitative electron probe microanalysis of ultra-light elements (boron - oxygen), in Electron Probe Quantitation, ed. K.F.J. Heinrich and D.E. Newbury, Plenum Press, NY, 145-161
Bastin, G.F. and Heijligers, H.J.M. (1992) Present and future of light element analysis with electron beam instruments, Microbeam Analysis, 1, 61-73.
Fialin, M. and Remond, G. (1993) Electron probe microanalysis of oxygen in strongly insulating oxides, Microbeam Analysis, 2, 179-189.
Goldstein, J.J., Choi, S.K., van Loo, F.J.J., Heijligers, H.J.M., Dijkstra, J.M. and Bastin, G.F. (1991) The influence of surface oxygen contamination of bulk EPMA of oxygen in ternary titanium-oxygen-compounds, in D.G. Howitt, ed., Microbeam Analysis, 57-58.
McGee, J. J. and Anovitz, L. M. (1996) Electron probe microanalysis of geologic materials for boron, in E.S. Grew and L.M. Anovitz, ed., Reviews in Mineralogy Vol. 33, Boron: Mineralogy, Petrology and Geochemistry, 771-788
McGuire, A.V., Francis, C.A., and Dyar, M.D. (1992) Mineral standards for electron microprobe analysis of oxygen, American Mineralogist, 77, 1087-1091.
Raudsepp, M. (1995) Recent advances in the electron-probe micro-analysis of minerals for the light elements. Canadian Mineralogist, 33, 203-218