Save Custom Analysis Format #3 (J.H.)
This menu will automatically create a custom file format (J.H. format). This format is a tab delimited ASCII file and contains extensive information including elemental, oxide, atomic weight percents, detection limits, analytical error (percent error), raw k-ratios, raw and corrected x-ray intensities, background and net counts, count times, deadtimes, beam current, stage positions, relative distance (in microns) and standard counts.
This file format was specified by John Hanchar at George Washington University and cannot be modified for other applications. A short explanation of the various column labels used for this custom output format is given here, but note that in reality, the symbol (El) will be replaced by the actual element symbol:
LINE Line number
El AT% Atomic weight percent
El WT% Elemental weight percent
El (O2) Oxide weight percent
TOTAL Total weight percent
El CDL99 Detection limit in elemental weight percent at 99% confidence
El %ERR Analytical error in relative percent (one sigma)
El K-RAW Elemental raw k-ratio (unk counts/standard counts)
El ONCNT On-peak count intensity (cps/nominal beam)
El OFCNT Off-peak count intensity (cps/nominal beam)
El NECNT Net (off-peak corrected) count intensity (cps/nominal beam)
El ONTIM On-peak counting time
El HITIM High off-peak counting time
El LOTIM Low off-peak counting time
El DETIM Deadtime correction factor (in secs)
BEAMCUR Beam current (in nA)
X-POS X stage position
Y-POS Y stage position
Z-POS Z stage position
RELDIST Relative distance (in microns)
El STDCTS Standard counts (cps/nominal beam)
The elemental raw k-ratios and x-ray intensities are corrected for deadtime, beam current and normalized to cps in addition to background, Time Dependent Intensity (TDI), area peak factors and spectral interference corrections.