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NI Digital Multimeters

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Table of contents

  • NI Digital Multimeters Help
    • Related Documentation
    • Using Help
      • Conventions
      • Navigating Help (Windows Only)
      • Searching Help (Windows Only)
      • Printing Help File Topics (Windows Only)
    • Fundamentals
      • Measurement Quality
        • Accuracy
        • Sensitivity
        • Resolution
        • Noise
        • Precision
      • Measurement Considerations
        • Normal and Common-Mode Signals
        • Normal-Mode Rejection Ratio (NMRR)
        • Common-Mode Rejection Ratio (CMRR)
        • Effective Common-Mode Rejection Ratio (ECMRR)
        • Input Resistance
        • Burden Voltage
        • Thermal Voltages
        • Settling Time
        • Resistor Self-Heating
        • Dielectric Absorption
        • Residual Impedance
        • Stray Admittance
    • Devices
      • NI 4072
        • Self-Calibration
        • Front Panel Connections
          • Capacitance
          • Inductance
          • DC Voltage
          • AC Current
          • AC Voltage
          • DC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • Frequency/Period
          • SCXI Communication
          • Triggering
          • Temperature (Thermocouple)
          • Temperature (2-wire RTD)
          • Temperature (4-wire RTD)
          • Temperature (Thermistor)
        • DMM Measurements
          • DMM Measurement Cycle
            • Settling Time
            • Aperture Time
            • ADC Calibration
            • Auto Zero
            • Overrange/Underrange
          • DMM Measurement Defaults
          • Capacitance/Inductance
            • Theoretical Background
              • Impedance
              • Admittance
              • Capacitors
              • Inductors
            • Model
            • Test Signal
            • Measurement Considerations
              • Frequency Effects of Real-World Components
              • Temperature Effects
              • Cabling
              • Noise Pickup
            • DC Bias
            • OPEN/SHORT Compensation
            • Offset Nulling
          • DC Voltage
            • DC Noise Rejection
            • Handling High DC Voltages
            • Optimizing Low-Voltage Measurements
            • Offset Nulling
            • Selecting Aperture Time for DC Measurements
          • AC Voltage
            • DC and AC Coupling
            • Frequency Response
            • AC RMS Noise
            • Crest Factor
            • Offset Errors
          • DC and AC Current
            • Input Protection
            • Low-Current Measurement Considerations
            • High Current (Up to 10 A) Measurement Considerations
            • Offset Nulling
          • Resistance
            • 2-Wire Resistance Measurements
            • 4-Wire Resistance Measurements
            • Offset Compensated Ohms
            • Offset Nulling
            • System Considerations for Resistance Measurements
            • Optimizing for High-Resistance Measurements
            • Measuring on the 100 MOhm Range
            • Offset Nulling
          • Frequency/Period
          • Diode
          • Temperature
            • Thermocouples
            • RTDs
            • Thermistors
        • Waveform Acquisitions
          • Waveform Acquisition Defaults
          • Waveform Acquisition Measurement Cycle
          • Analog Bandwidth
          • Nyquist Theorem
          • Overranging
          • Input Coupling
          • Sample Rate
          • DC Noise Rejection for Waveforms
          • Transient Measurement Considerations
          • Current Waveforms
      • NI 4071
        • Self-Calibration
        • Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • Frequency/Period
          • SCXI Communication
          • Triggering
          • Temperature (Thermocouple)
          • Temperature (2-wire RTD)
          • Temperature (4-wire RTD)
          • Temperature (Thermistor)
        • DMM Measurements
          • DMM Measurement Cycle
            • Settling Time
            • Aperture Time
            • ADC Calibration
            • Auto Zero
            • Overrange/Underrange
          • DMM Measurement Defaults
          • DC Voltage
            • DC Noise Rejection
            • Handling High DC Voltages
            • Optimizing Low-Voltage Measurements
            • Offset Nulling
            • Selecting Aperture Time for DC Measurements
          • AC Voltage
            • DC and AC Coupling
            • Frequency Response
            • AC RMS Noise
            • Crest Factor
            • Offset Errors
          • DC and AC Current
            • Input Protection
            • Low-Current Measurement Considerations
            • High-Current (Up to 10 A) Measurement Considerations
            • Offset Nulling
          • Resistance
            • 2-Wire Resistance Measurements
            • 4-Wire Resistance Measurements
            • Offset Compensated Ohms
            • System Considerations for Resistance Measurements
            • Optimizing for High-Resistance Measurements
            • Measuring on the 100 MOhm Range
            • Offset Nulling
          • Frequency/Period
          • Diode
          • Temperature
            • Thermocouples
            • RTDs
            • Thermistors
        • Waveform Acquisitions
          • Waveform Acquisition Defaults
          • Waveform Acquisition Measurement Cycle
          • Analog Bandwidth
          • Nyquist Theorem
          • Overranging
          • Input Coupling
          • Sample Rate
          • DC Noise Rejection for Waveforms
          • Transient Measurement Considerations
          • Current Waveforms
      • NI 4070
        • Self-Calibration
        • Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • Frequency/Period
          • SCXI Communication
          • Triggering
          • Temperature (Thermocouple)
          • Temperature (2-wire RTD)
          • Temperature (4-wire RTD)
          • Temperature (Thermistor)
        • DMM Measurements
          • DMM Measurement Cycle
            • Settling Time
            • Aperture Time
            • ADC Calibration
            • Auto Zero
            • Overrange/Underrange
          • DMM Measurement Defaults
          • DC Voltage
            • DC Noise Rejection
            • Handling High DC Voltages
            • Optimizing Low-Voltage Measurements
            • Offset Nulling
            • Selecting Aperture Time for DC Measurements
          • AC Voltage
            • DC and AC Coupling
            • Frequency Response
            • AC RMS Noise
            • Crest Factor
            • Offset Errors
          • DC and AC Current
            • Input Protection
            • Low-Current Measurement Considerations
            • High-Current (Up to 10 A) Measurement Considerations
            • Offset Nulling
          • Resistance
            • 2-Wire Resistance Measurements
            • 4-Wire Resistance Measurements
            • Offset Compensated Ohms
            • System Considerations for Resistance Measurements
            • Optimizing for High-Resistance Measurements
            • Measuring on the 100 MOhm Range
            • Offset Nulling
          • Frequency/Period
          • Diode
          • Temperature
            • Thermocouples
            • RTDs
            • Thermistors
        • Waveform Acquisitions
          • Waveform Acquisition Defaults
          • Waveform Acquisition Measurement Cycle
          • Analog Bandwidth
          • Nyquist Theorem
          • Overranging
          • Input Coupling
          • Sample Rate
          • DC Noise Rejection for Waveforms
          • Transient Measurement Considerations
          • Current Waveforms
      • NI 4065
        • NI PXI/PCI/PCIe-4065 Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • SCXI Communication
          • Triggering
          • Temperature (Thermocouple)
          • Temperature (2-wire RTD)
          • Temperature (4-wire RTD)
          • Temperature (Thermistor)
        • NI USB-4065 Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • Triggering
          • Temperature (Thermocouple)
          • Temperature (2-wire RTD)
          • Temperature (4-wire RTD)
          • Temperature (Thermistor)
        • DMM Measurements
          • DMM Measurement Cycle
            • Settling Time
            • Aperture Time
            • Auto Zero
            • Overrange/Underrange
          • DMM Measurement Defaults
          • DC Voltage
            • DC Noise Rejection
            • Handling High DC Voltages
          • AC Voltage
            • DC and AC Coupling
          • DC and AC Current
            • Input Protection
            • High-Current (Up to 10 A) Measurement Considerations
          • Resistance
            • 2-Wire Resistance Measurements
            • 4-Wire Resistance Measurements
            • System Considerations for Resistance Measurements
            • Optimizing for High-Resistance Measurements
            • Measuring on the 100 MOhm Range
          • Diode
          • Temperature
            • Thermocouples
            • RTDs
            • Thermistors
      • NI 4060
        • Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • SCXI Communication
          • Triggering
      • NI 4050
        • Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • Voltage Drop Across a Diode
      • Accessories
    • Integration and System Considerations
      • Environment
      • Chassis
      • PXI Express Compatibility
      • USB System Considerations
      • Using Switches
        • Switch Fundamentals
          • Relay Forms
          • Topologies
          • Settling Time and Switches
        • Load Switching
          • Switching Voltages
            • Low Voltages
            • High Voltages
            • Voltages with Large Common-Mode Components
          • Switching Current
          • Switching Capacitance and Inductance
        • Scanning
          • Handshaking Scanning
          • Synchronous Scanning
    • DMM Soft Front Panel
    • Programming with NI-DMM
      • Getting Started
        • Using NI-DMM in LabVIEW
          • Considerations for Using the LabVIEW Real-Time Module
        • Using NI-DMM in LabWindows/CVI
        • Using NI-DMM in Visual C++
        • Using NI-DMM in Visual Basic
      • Programming Flow
        • Initialize
        • Configuring the Hardware
        • Acquiring Data
        • Close
        • Using Attributes and Properties with NI-DMM
      • Features
        • Performing Self-Calibration
        • Configuring Auto Zero
        • Configuring Auto Range
        • Configuring Offset Compensated Ohms
        • Configuring ADC Calibration
        • Configuring Input Resistance
        • Selecting DC Noise Rejection
        • Configure Waveform Coupling
        • Configuring Frequency Measurements
        • Configuring Period Measurements
        • Simulating NI Digital Multimeters
        • Measuring Current
        • Triggering
          • Single Point Acquisitions
          • Multiple Point Acquisitions
          • Continuous Acquisitions
          • Generating Measurement Complete
          • Scanning Switch Modules
          • LabWindows/CVI Trigger Routing
          • LabVIEW Trigger Routing
        • Acquiring Waveforms
          • Single Waveform Acquisitions
          • Multiple Waveform Acquisitions
          • Synchronizing Waveform Measurements
          • Acquiring High-Frequency Waveforms
      • Configuring Measurement Timing
      • Examples
      • NI-DMM LabVIEW Reference
    • Operating System Support
    • Glossary
    • Important Information
      • Warranty
      • Copyright
      • Patents
      • Trademarks
      • Warning Regarding Use of National Instruments Products
    • Technical Support and Professional Services

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