documentation.HELP! NI Digital Multimeters Documentation

Front Panel Connections

NI Digital Multimeters

previous page next page

Front Panel Connections

Move the mouse over the text to view the wiring diagrams for the NI 4072, and click for additional information.

Capacitance

Inductance


DC Voltage


AC Voltage


DC Current


AC Current


2-Wire Resistance


4-Wire Resistance


Voltage Drop Across a Diode


Frequency/Period


Voltage Waveform


Current Waveform


SCXI Communication


Triggering


Temperature (Thermocouple)


Temperature (2-wire RTD)


Temperature (4-wire RTD)


Temperature (Thermistor)
previous page start next page

Menu

  • Homepage

Table of contents

  • NI Digital Multimeters Help
    • Related Documentation
    • Using Help
      • Conventions
      • Navigating Help (Windows Only)
      • Searching Help (Windows Only)
      • Printing Help File Topics (Windows Only)
    • Fundamentals
      • Measurement Quality
        • Accuracy
        • Sensitivity
        • Resolution
        • Noise
        • Precision
      • Measurement Considerations
        • Normal and Common-Mode Signals
        • Normal-Mode Rejection Ratio (NMRR)
        • Common-Mode Rejection Ratio (CMRR)
        • Effective Common-Mode Rejection Ratio (ECMRR)
        • Input Resistance
        • Burden Voltage
        • Thermal Voltages
        • Settling Time
        • Resistor Self-Heating
        • Dielectric Absorption
        • Residual Impedance
        • Stray Admittance
    • Devices
      • NI 4072
        • Self-Calibration
        • Front Panel Connections
          • Capacitance
          • Inductance
          • DC Voltage
          • AC Current
          • AC Voltage
          • DC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • Frequency/Period
          • SCXI Communication
          • Triggering
          • Temperature (Thermocouple)
          • Temperature (2-wire RTD)
          • Temperature (4-wire RTD)
          • Temperature (Thermistor)
        • DMM Measurements
          • DMM Measurement Cycle
            • Settling Time
            • Aperture Time
            • ADC Calibration
            • Auto Zero
            • Overrange/Underrange
          • DMM Measurement Defaults
          • Capacitance/Inductance
            • Theoretical Background
              • Impedance
              • Admittance
              • Capacitors
              • Inductors
            • Model
            • Test Signal
            • Measurement Considerations
              • Frequency Effects of Real-World Components
              • Temperature Effects
              • Cabling
              • Noise Pickup
            • DC Bias
            • OPEN/SHORT Compensation
            • Offset Nulling
          • DC Voltage
            • DC Noise Rejection
            • Handling High DC Voltages
            • Optimizing Low-Voltage Measurements
            • Offset Nulling
            • Selecting Aperture Time for DC Measurements
          • AC Voltage
            • DC and AC Coupling
            • Frequency Response
            • AC RMS Noise
            • Crest Factor
            • Offset Errors
          • DC and AC Current
            • Input Protection
            • Low-Current Measurement Considerations
            • High Current (Up to 10 A) Measurement Considerations
            • Offset Nulling
          • Resistance
            • 2-Wire Resistance Measurements
            • 4-Wire Resistance Measurements
            • Offset Compensated Ohms
            • Offset Nulling
            • System Considerations for Resistance Measurements
            • Optimizing for High-Resistance Measurements
            • Measuring on the 100 MOhm Range
            • Offset Nulling
          • Frequency/Period
          • Diode
          • Temperature
            • Thermocouples
            • RTDs
            • Thermistors
        • Waveform Acquisitions
          • Waveform Acquisition Defaults
          • Waveform Acquisition Measurement Cycle
          • Analog Bandwidth
          • Nyquist Theorem
          • Overranging
          • Input Coupling
          • Sample Rate
          • DC Noise Rejection for Waveforms
          • Transient Measurement Considerations
          • Current Waveforms
      • NI 4071
        • Self-Calibration
        • Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • Frequency/Period
          • SCXI Communication
          • Triggering
          • Temperature (Thermocouple)
          • Temperature (2-wire RTD)
          • Temperature (4-wire RTD)
          • Temperature (Thermistor)
        • DMM Measurements
          • DMM Measurement Cycle
            • Settling Time
            • Aperture Time
            • ADC Calibration
            • Auto Zero
            • Overrange/Underrange
          • DMM Measurement Defaults
          • DC Voltage
            • DC Noise Rejection
            • Handling High DC Voltages
            • Optimizing Low-Voltage Measurements
            • Offset Nulling
            • Selecting Aperture Time for DC Measurements
          • AC Voltage
            • DC and AC Coupling
            • Frequency Response
            • AC RMS Noise
            • Crest Factor
            • Offset Errors
          • DC and AC Current
            • Input Protection
            • Low-Current Measurement Considerations
            • High-Current (Up to 10 A) Measurement Considerations
            • Offset Nulling
          • Resistance
            • 2-Wire Resistance Measurements
            • 4-Wire Resistance Measurements
            • Offset Compensated Ohms
            • System Considerations for Resistance Measurements
            • Optimizing for High-Resistance Measurements
            • Measuring on the 100 MOhm Range
            • Offset Nulling
          • Frequency/Period
          • Diode
          • Temperature
            • Thermocouples
            • RTDs
            • Thermistors
        • Waveform Acquisitions
          • Waveform Acquisition Defaults
          • Waveform Acquisition Measurement Cycle
          • Analog Bandwidth
          • Nyquist Theorem
          • Overranging
          • Input Coupling
          • Sample Rate
          • DC Noise Rejection for Waveforms
          • Transient Measurement Considerations
          • Current Waveforms
      • NI 4070
        • Self-Calibration
        • Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • Frequency/Period
          • SCXI Communication
          • Triggering
          • Temperature (Thermocouple)
          • Temperature (2-wire RTD)
          • Temperature (4-wire RTD)
          • Temperature (Thermistor)
        • DMM Measurements
          • DMM Measurement Cycle
            • Settling Time
            • Aperture Time
            • ADC Calibration
            • Auto Zero
            • Overrange/Underrange
          • DMM Measurement Defaults
          • DC Voltage
            • DC Noise Rejection
            • Handling High DC Voltages
            • Optimizing Low-Voltage Measurements
            • Offset Nulling
            • Selecting Aperture Time for DC Measurements
          • AC Voltage
            • DC and AC Coupling
            • Frequency Response
            • AC RMS Noise
            • Crest Factor
            • Offset Errors
          • DC and AC Current
            • Input Protection
            • Low-Current Measurement Considerations
            • High-Current (Up to 10 A) Measurement Considerations
            • Offset Nulling
          • Resistance
            • 2-Wire Resistance Measurements
            • 4-Wire Resistance Measurements
            • Offset Compensated Ohms
            • System Considerations for Resistance Measurements
            • Optimizing for High-Resistance Measurements
            • Measuring on the 100 MOhm Range
            • Offset Nulling
          • Frequency/Period
          • Diode
          • Temperature
            • Thermocouples
            • RTDs
            • Thermistors
        • Waveform Acquisitions
          • Waveform Acquisition Defaults
          • Waveform Acquisition Measurement Cycle
          • Analog Bandwidth
          • Nyquist Theorem
          • Overranging
          • Input Coupling
          • Sample Rate
          • DC Noise Rejection for Waveforms
          • Transient Measurement Considerations
          • Current Waveforms
      • NI 4065
        • NI PXI/PCI/PCIe-4065 Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • SCXI Communication
          • Triggering
          • Temperature (Thermocouple)
          • Temperature (2-wire RTD)
          • Temperature (4-wire RTD)
          • Temperature (Thermistor)
        • NI USB-4065 Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • Triggering
          • Temperature (Thermocouple)
          • Temperature (2-wire RTD)
          • Temperature (4-wire RTD)
          • Temperature (Thermistor)
        • DMM Measurements
          • DMM Measurement Cycle
            • Settling Time
            • Aperture Time
            • Auto Zero
            • Overrange/Underrange
          • DMM Measurement Defaults
          • DC Voltage
            • DC Noise Rejection
            • Handling High DC Voltages
          • AC Voltage
            • DC and AC Coupling
          • DC and AC Current
            • Input Protection
            • High-Current (Up to 10 A) Measurement Considerations
          • Resistance
            • 2-Wire Resistance Measurements
            • 4-Wire Resistance Measurements
            • System Considerations for Resistance Measurements
            • Optimizing for High-Resistance Measurements
            • Measuring on the 100 MOhm Range
          • Diode
          • Temperature
            • Thermocouples
            • RTDs
            • Thermistors
      • NI 4060
        • Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • 4-Wire Resistance
          • Voltage Drop Across a Diode
          • SCXI Communication
          • Triggering
      • NI 4050
        • Front Panel Connections
          • DC Voltage
          • AC Voltage
          • DC Current
          • AC Current
          • 2-Wire Resistance
          • Voltage Drop Across a Diode
      • Accessories
    • Integration and System Considerations
      • Environment
      • Chassis
      • PXI Express Compatibility
      • USB System Considerations
      • Using Switches
        • Switch Fundamentals
          • Relay Forms
          • Topologies
          • Settling Time and Switches
        • Load Switching
          • Switching Voltages
            • Low Voltages
            • High Voltages
            • Voltages with Large Common-Mode Components
          • Switching Current
          • Switching Capacitance and Inductance
        • Scanning
          • Handshaking Scanning
          • Synchronous Scanning
    • DMM Soft Front Panel
    • Programming with NI-DMM
      • Getting Started
        • Using NI-DMM in LabVIEW
          • Considerations for Using the LabVIEW Real-Time Module
        • Using NI-DMM in LabWindows/CVI
        • Using NI-DMM in Visual C++
        • Using NI-DMM in Visual Basic
      • Programming Flow
        • Initialize
        • Configuring the Hardware
        • Acquiring Data
        • Close
        • Using Attributes and Properties with NI-DMM
      • Features
        • Performing Self-Calibration
        • Configuring Auto Zero
        • Configuring Auto Range
        • Configuring Offset Compensated Ohms
        • Configuring ADC Calibration
        • Configuring Input Resistance
        • Selecting DC Noise Rejection
        • Configure Waveform Coupling
        • Configuring Frequency Measurements
        • Configuring Period Measurements
        • Simulating NI Digital Multimeters
        • Measuring Current
        • Triggering
          • Single Point Acquisitions
          • Multiple Point Acquisitions
          • Continuous Acquisitions
          • Generating Measurement Complete
          • Scanning Switch Modules
          • LabWindows/CVI Trigger Routing
          • LabVIEW Trigger Routing
        • Acquiring Waveforms
          • Single Waveform Acquisitions
          • Multiple Waveform Acquisitions
          • Synchronizing Waveform Measurements
          • Acquiring High-Frequency Waveforms
      • Configuring Measurement Timing
      • Examples
      • NI-DMM LabVIEW Reference
    • Operating System Support
    • Glossary
    • Important Information
      • Warranty
      • Copyright
      • Patents
      • Trademarks
      • Warning Regarding Use of National Instruments Products
    • Technical Support and Professional Services

Get in touch

Submit feedback about this site to:

  • [email protected]

© documentation.help. Design: rehmann.co.