documentation.HELP! NI Digital Multimeters Documentation

NI Digital Multimeters Help

NI Digital Multimeters

Table of contents

• NI Digital Multimeters Help
  • Related Documentation
  • Using Help
    • Conventions
    • Navigating Help (Windows Only)
    • Searching Help (Windows Only)
    • Printing Help File Topics (Windows Only)
  • Fundamentals
    • Measurement Quality
      • Accuracy
      • Sensitivity
      • Resolution
      • Noise
      • Precision
    • Measurement Considerations
      • Normal and Common-Mode Signals
      • Normal-Mode Rejection Ratio (NMRR)
      • Common-Mode Rejection Ratio (CMRR)
      • Effective Common-Mode Rejection Ratio (ECMRR)
      • Input Resistance
      • Burden Voltage
      • Thermal Voltages
      • Settling Time
      • Resistor Self-Heating
      • Dielectric Absorption
      • Residual Impedance
      • Stray Admittance
  • Devices
    • NI 4072
      • Self-Calibration
      • Front Panel Connections
        • Capacitance
        • Inductance
        • DC Voltage
        • AC Current
        • AC Voltage
        • DC Current
        • 2-Wire Resistance
        • 4-Wire Resistance
        • Voltage Drop Across a Diode
        • Frequency/Period
        • SCXI Communication
        • Triggering
        • Temperature (Thermocouple)
        • Temperature (2-wire RTD)
        • Temperature (4-wire RTD)
        • Temperature (Thermistor)
      • DMM Measurements
        • DMM Measurement Cycle
          • Settling Time
          • Aperture Time
          • ADC Calibration
          • Auto Zero
          • Overrange/Underrange
        • DMM Measurement Defaults
        • Capacitance/Inductance
          • Theoretical Background
            • Impedance
            • Admittance
            • Capacitors
            • Inductors
          • Model
          • Test Signal
          • Measurement Considerations
            • Frequency Effects of Real-World Components
            • Temperature Effects
            • Cabling
            • Noise Pickup
          • DC Bias
          • OPEN/SHORT Compensation
          • Offset Nulling
        • DC Voltage
          • DC Noise Rejection
          • Handling High DC Voltages
          • Optimizing Low-Voltage Measurements
          • Offset Nulling
          • Selecting Aperture Time for DC Measurements
        • AC Voltage
          • DC and AC Coupling
          • Frequency Response
          • AC RMS Noise
          • Crest Factor
          • Offset Errors
        • DC and AC Current
          • Input Protection
          • Low-Current Measurement Considerations
          • High Current (Up to 10 A) Measurement Considerations
          • Offset Nulling
        • Resistance
          • 2-Wire Resistance Measurements
          • 4-Wire Resistance Measurements
          • Offset Compensated Ohms
          • Offset Nulling
          • System Considerations for Resistance Measurements
          • Optimizing for High-Resistance Measurements
          • Measuring on the 100 MOhm Range
          • Offset Nulling
        • Frequency/Period
        • Diode
        • Temperature
          • Thermocouples
          • RTDs
          • Thermistors
      • Waveform Acquisitions
        • Waveform Acquisition Defaults
        • Waveform Acquisition Measurement Cycle
        • Analog Bandwidth
        • Nyquist Theorem
        • Overranging
        • Input Coupling
        • Sample Rate
        • DC Noise Rejection for Waveforms
        • Transient Measurement Considerations
        • Current Waveforms
    • NI 4071
      • Self-Calibration
      • Front Panel Connections
        • DC Voltage
        • AC Voltage
        • DC Current
        • AC Current
        • 2-Wire Resistance
        • 4-Wire Resistance
        • Voltage Drop Across a Diode
        • Frequency/Period
        • SCXI Communication
        • Triggering
        • Temperature (Thermocouple)
        • Temperature (2-wire RTD)
        • Temperature (4-wire RTD)
        • Temperature (Thermistor)
      • DMM Measurements
        • DMM Measurement Cycle
          • Settling Time
          • Aperture Time
          • ADC Calibration
          • Auto Zero
          • Overrange/Underrange
        • DMM Measurement Defaults
        • DC Voltage
          • DC Noise Rejection
          • Handling High DC Voltages
          • Optimizing Low-Voltage Measurements
          • Offset Nulling
          • Selecting Aperture Time for DC Measurements
        • AC Voltage
          • DC and AC Coupling
          • Frequency Response
          • AC RMS Noise
          • Crest Factor
          • Offset Errors
        • DC and AC Current
          • Input Protection
          • Low-Current Measurement Considerations
          • High-Current (Up to 10 A) Measurement Considerations
          • Offset Nulling
        • Resistance
          • 2-Wire Resistance Measurements
          • 4-Wire Resistance Measurements
          • Offset Compensated Ohms
          • System Considerations for Resistance Measurements
          • Optimizing for High-Resistance Measurements
          • Measuring on the 100 MOhm Range
          • Offset Nulling
        • Frequency/Period
        • Diode
        • Temperature
          • Thermocouples
          • RTDs
          • Thermistors
      • Waveform Acquisitions
        • Waveform Acquisition Defaults
        • Waveform Acquisition Measurement Cycle
        • Analog Bandwidth
        • Nyquist Theorem
        • Overranging
        • Input Coupling
        • Sample Rate
        • DC Noise Rejection for Waveforms
        • Transient Measurement Considerations
        • Current Waveforms
    • NI 4070
      • Self-Calibration
      • Front Panel Connections
        • DC Voltage
        • AC Voltage
        • DC Current
        • AC Current
        • 2-Wire Resistance
        • 4-Wire Resistance
        • Voltage Drop Across a Diode
        • Frequency/Period
        • SCXI Communication
        • Triggering
        • Temperature (Thermocouple)
        • Temperature (2-wire RTD)
        • Temperature (4-wire RTD)
        • Temperature (Thermistor)
      • DMM Measurements
        • DMM Measurement Cycle
          • Settling Time
          • Aperture Time
          • ADC Calibration
          • Auto Zero
          • Overrange/Underrange
        • DMM Measurement Defaults
        • DC Voltage
          • DC Noise Rejection
          • Handling High DC Voltages
          • Optimizing Low-Voltage Measurements
          • Offset Nulling
          • Selecting Aperture Time for DC Measurements
        • AC Voltage
          • DC and AC Coupling
          • Frequency Response
          • AC RMS Noise
          • Crest Factor
          • Offset Errors
        • DC and AC Current
          • Input Protection
          • Low-Current Measurement Considerations
          • High-Current (Up to 10 A) Measurement Considerations
          • Offset Nulling
        • Resistance
          • 2-Wire Resistance Measurements
          • 4-Wire Resistance Measurements
          • Offset Compensated Ohms
          • System Considerations for Resistance Measurements
          • Optimizing for High-Resistance Measurements
          • Measuring on the 100 MOhm Range
          • Offset Nulling
        • Frequency/Period
        • Diode
        • Temperature
          • Thermocouples
          • RTDs
          • Thermistors
      • Waveform Acquisitions
        • Waveform Acquisition Defaults
        • Waveform Acquisition Measurement Cycle
        • Analog Bandwidth
        • Nyquist Theorem
        • Overranging
        • Input Coupling
        • Sample Rate
        • DC Noise Rejection for Waveforms
        • Transient Measurement Considerations
        • Current Waveforms
    • NI 4065
      • NI PXI/PCI/PCIe-4065 Front Panel Connections
        • DC Voltage
        • AC Voltage
        • DC Current
        • AC Current
        • 2-Wire Resistance
        • 4-Wire Resistance
        • Voltage Drop Across a Diode
        • SCXI Communication
        • Triggering
        • Temperature (Thermocouple)
        • Temperature (2-wire RTD)
        • Temperature (4-wire RTD)
        • Temperature (Thermistor)
      • NI USB-4065 Front Panel Connections
        • DC Voltage
        • AC Voltage
        • DC Current
        • AC Current
        • 2-Wire Resistance
        • 4-Wire Resistance
        • Voltage Drop Across a Diode
        • Triggering
        • Temperature (Thermocouple)
        • Temperature (2-wire RTD)
        • Temperature (4-wire RTD)
        • Temperature (Thermistor)
      • DMM Measurements
        • DMM Measurement Cycle
          • Settling Time
          • Aperture Time
          • Auto Zero
          • Overrange/Underrange
        • DMM Measurement Defaults
        • DC Voltage
          • DC Noise Rejection
          • Handling High DC Voltages
        • AC Voltage
          • DC and AC Coupling
        • DC and AC Current
          • Input Protection
          • High-Current (Up to 10 A) Measurement Considerations
        • Resistance
          • 2-Wire Resistance Measurements
          • 4-Wire Resistance Measurements
          • System Considerations for Resistance Measurements
          • Optimizing for High-Resistance Measurements
          • Measuring on the 100 MOhm Range
        • Diode
        • Temperature
          • Thermocouples
          • RTDs
          • Thermistors
    • NI 4060
      • Front Panel Connections
        • DC Voltage
        • AC Voltage
        • DC Current
        • AC Current
        • 2-Wire Resistance
        • 4-Wire Resistance
        • Voltage Drop Across a Diode
        • SCXI Communication
        • Triggering
    • NI 4050
      • Front Panel Connections
        • DC Voltage
        • AC Voltage
        • DC Current
        • AC Current
        • 2-Wire Resistance
        • Voltage Drop Across a Diode
    • Accessories
  • Integration and System Considerations
    • Environment
    • Chassis
    • PXI Express Compatibility
    • USB System Considerations
    • Using Switches
      • Switch Fundamentals
        • Relay Forms
        • Topologies
        • Settling Time and Switches
      • Load Switching
        • Switching Voltages
          • Low Voltages
          • High Voltages
          • Voltages with Large Common-Mode Components
        • Switching Current
        • Switching Capacitance and Inductance
      • Scanning
        • Handshaking Scanning
        • Synchronous Scanning
  • DMM Soft Front Panel
  • Programming with NI-DMM
    • Getting Started
      • Using NI-DMM in LabVIEW
        • Considerations for Using the LabVIEW Real-Time Module
      • Using NI-DMM in LabWindows/CVI
      • Using NI-DMM in Visual C++
      • Using NI-DMM in Visual Basic
    • Programming Flow
      • Initialize
      • Configuring the Hardware
      • Acquiring Data
      • Close
      • Using Attributes and Properties with NI-DMM
    • Features
      • Performing Self-Calibration
      • Configuring Auto Zero
      • Configuring Auto Range
      • Configuring Offset Compensated Ohms
      • Configuring ADC Calibration
      • Configuring Input Resistance
      • Selecting DC Noise Rejection
      • Configure Waveform Coupling
      • Configuring Frequency Measurements
      • Configuring Period Measurements
      • Simulating NI Digital Multimeters
      • Measuring Current
      • Triggering
        • Single Point Acquisitions
        • Multiple Point Acquisitions
        • Continuous Acquisitions
        • Generating Measurement Complete
        • Scanning Switch Modules
        • LabWindows/CVI Trigger Routing
        • LabVIEW Trigger Routing
      • Acquiring Waveforms
        • Single Waveform Acquisitions
        • Multiple Waveform Acquisitions
        • Synchronizing Waveform Measurements
        • Acquiring High-Frequency Waveforms
    • Configuring Measurement Timing
    • Examples
    • NI-DMM LabVIEW Reference
  • Operating System Support
  • Glossary
  • Important Information
    • Warranty
    • Copyright
    • Patents
    • Trademarks
    • Warning Regarding Use of National Instruments Products
  • Technical Support and Professional Services

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