Testing Analog Input

NI-DAQ Measurement & Automation Explorer

Testing Analog Input

To test the AI functions of a DAQ device, complete the following steps:

  1. Expand Devices and Interfaces»Traditional NI-DAQ (Legacy) Devices in the configuration tree.
  2. Right-click the device you want to test. Select Test Panels to display the test panel for the device.

    –or–

    Select the device you want to test. Click Test Panels in the MAX toolbar.

    The test panel appears. The Analog Input tab is selected by default.

  3. Select a DAQ device channel from Channel.
  4. Enter High and Low input limits for the y-axis of the chart.
  5. Select a Data Mode.
    • Strip Chart—Acquire samples continuously at a software-determined rate.
    • One-Shot—Acquire 1000 samples at the frequency defined by Sample Rate (Hz).
    • Continuous—Acquire continuous samples at the frequency defined by Sample Rate (Hz).

    Selecting either one-shot or continuous data mode enables both Start and Sample Rate (Hz). Enter a sampling frequency in Sample Rate (Hz). Click Start to begin data acquisition. Click Stop to cancel the test.

    Selecting Strip Chart runs the test automatically.

  6. Select a Y Scale Mode.
    • Auto Scale—MAX selects the scaling that best fits the data.
    • Full Range—The y-axis is scaled using the High and Low input range values.
  7. If there is a problem with the device, the Error indicator turns red. Click Error Codes to display detailed information about the error.
  8. Click Close when you are finished.