Testing Digital I/O

NI-DAQ Measurement & Automation Explorer

Testing Digital I/O

To test the DIO functions of a DAQ device, complete the following steps:

  1. Expand Devices and Interfaces»Traditional NI-DAQ (Legacy) Devices in the configuration tree.
  2. Right-click the device you want to test. Select Test Panels to display the test panel for the device.

    –or–

    Select the device you want to test. Click Test Panels in the MAX toolbar.

    The test panel appears. Click the Digital I/O tab.

  3. For each line listed under Line Direction Selection, click the Input or Output radio button to select an I/O direction.
  4. If output is selected, click the Logic Level for the line to select either a high (1) or low (0) state. Line State identifies high output by turning the indicator red, and low output by leaving the indicator unlit.
  5. If there is a problem with the device, the Error indicator turns red. Click Error Codes to display detailed information about the error.
  6. Click Close when you are finished.