Testing Counter I/O

To test the counter I/O functions of a DAQ device, complete the following steps:

1. Expand Devices and Interfaces»Traditional NI-DAQ (Legacy) Devices in the configuration tree.
2. Right-click the device you want to test. Select Test Panels to display the test panel for the device.

   –or–

   Select the device you want to test. Click Test Panels in the MAX toolbar.

   The test panel appears. Click the Counter I/O tab.

3. Select a DAQ device GPCTR channel from Counter.
4. Select a Counter Mode.
   • Pulse Train Generation—Output a periodic signal with user-defined frequency and duty cycle.
   • Single Pulse Generation—Output a single pulse with user-defined delay and pulse width.
   • Simple Event Counting—Count a user-defined event.

   If you select Pulse Train Generation, enter Frequency and Duty Cycle values.

   If you select Single Pulse Generation, enter Delay (sec) and Pulse Width (sec) values.

   If you select Simple Event Counting, select an Event Source from the list of available signals. When you start the counter, Counter Value continuously updates with the current value.

5. Click Start to begin the test. Click Reset to cancel the test.
6. If there is a problem with the device, the Error indicator turns red. Click Error Codes to display detailed information about the error.
7. Click Close when you are finished.