documentation.HELP! NI-DAQ Measurement Documentation

Measurement Fundamentals

NI-DAQ Measurement

Table of contents

  • Measurement Fundamentals
    • Measurement System Overview
    • Signals
      • Analog
        • Connecting Analog Input Signals
          • Signal Sources
            • Floating Signal Sources
            • Grounded Signal Sources
          • Measurement System Types
            • Differential
              • Rejecting Common-Mode Voltages
            • Single-Ended
            • Pseudodifferential
        • Connecting Analog Output Signals
        • Sampling Considerations
          • Device Range
          • Input Limits
          • Sampling Rate
          • Resolution
          • Code Width
      • Digital
        • Connecting Digital I/O Signals
        • Counters
        • Digital Logic States
        • Duty Cycle
      • Signal Analysis
        • Filtering
        • Windowing
    • Signal Conditioning
      • Amplification
      • Linearization
      • Transducer Excitation
      • Isolation
    • Common Sensors
      • TEDS
        • Writing Data to TEDS Sensors
      • Strain Gages
        • Bridge Configurations
        • Signal Conditioning
      • Temperature Sensors
        • RTDs
          • Platinum RTD Types
          • Callendar-Van Dusen Equation
          • Signal Conditioning
        • Thermistors
          • Signal Conditioning
        • Thermocouples
          • Signal Conditioning
      • Encoders
        • Quadrature Encoders
        • Two-Pulse Encoders
        • Z Indexing
      • Accelerometers
      • LVDTs
      • RVDTs
      • Microphones
      • 2-Wire Resistance
      • 4-Wire Resistance
    • Synchronization
      • Types of Synchronization
      • Sources of Error
        • Jitter
        • Stability
        • Accuracy
        • Skew
    • Control
      • PID
      • Real Time
      • Loop Cycle Time
      • Jitter Overview
      • Event Response
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Table of contents

  • Measurement Fundamentals
    • Measurement System Overview
    • Signals
      • Analog
        • Connecting Analog Input Signals
          • Signal Sources
            • Floating Signal Sources
            • Grounded Signal Sources
          • Measurement System Types
            • Differential
              • Rejecting Common-Mode Voltages
            • Single-Ended
            • Pseudodifferential
        • Connecting Analog Output Signals
        • Sampling Considerations
          • Device Range
          • Input Limits
          • Sampling Rate
          • Resolution
          • Code Width
      • Digital
        • Connecting Digital I/O Signals
        • Counters
        • Digital Logic States
        • Duty Cycle
      • Signal Analysis
        • Filtering
        • Windowing
    • Signal Conditioning
      • Amplification
      • Linearization
      • Transducer Excitation
      • Isolation
    • Common Sensors
      • TEDS
        • Writing Data to TEDS Sensors
      • Strain Gages
        • Bridge Configurations
        • Signal Conditioning
      • Temperature Sensors
        • RTDs
          • Platinum RTD Types
          • Callendar-Van Dusen Equation
          • Signal Conditioning
        • Thermistors
          • Signal Conditioning
        • Thermocouples
          • Signal Conditioning
      • Encoders
        • Quadrature Encoders
        • Two-Pulse Encoders
        • Z Indexing
      • Accelerometers
      • LVDTs
      • RVDTs
      • Microphones
      • 2-Wire Resistance
      • 4-Wire Resistance
    • Synchronization
      • Types of Synchronization
      • Sources of Error
        • Jitter
        • Stability
        • Accuracy
        • Skew
    • Control
      • PID
      • Real Time
      • Loop Cycle Time
      • Jitter Overview
      • Event Response

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